
產(chǎn)品展示

雙面探針臺DPW-1200
X-Y travel coarse 300 mm x 300 mm X-Y travel fine 10 mm x 10 mm …

高壓探針臺HPW
Failure analysis 集成電路失效分析 Wafer level reliability 晶元可靠性認證 Device ch …

8寸探針臺PW-800
Failure analysis 集成電路失效分析 Wafer level reliability 晶元可靠性認證 Dev …

6寸探針臺PW-600
Failure analysis 集成電路失效分析 Wafer level reliability 晶元可靠性認證 …

經(jīng)濟型6寸探針臺MPW-600
Failure analysis 集成電路失效分析 Wafer level reliability 晶元可靠性認證 De …

4寸探針臺PW-400
Failure analysis 集成電路失效分析 Wafer level reliability 晶元可靠性認證 De …